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Ulrich E. Klotz · Study

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Ulrich E. Klotz

2 works· latest 2004· 1 institutionscluster: provisionalORCID 0000-0002-6033-1659

h-index2

i102

Citations168

Works here2

94

04

Most cited in this library

Critical review of the current status of thickness measurements for ultrathin SiO 2 on Si Part V: Results of a CCQM pilot study2004 · 141 citations
Business Reengineering1994 · 27 citations

Works

2 shown

Critical review of the current status of thickness measurements for ultrathin SiO 2 on Si Part V: Results of a CCQM pilot study

Surface and Interface Analysis·2004·34 authors

141citations

Business Reengineering

Vieweg+Teubner eBooks·1994·1 author·chapter

27citations