SZodixStudyAcademic Library

Shelves Open access

Study · an open academic library·Metadata from OpenAlex (CC0)·Shelves·OpenAlex metadata, de-duplicated

David C. Drain · Study

Home/Author

David C. Drain

5 works· latest 2008· 3 institutionscluster: provisional

h-index5

i105

Citations250

Works here5

96

97

98

02

08

Most cited in this library

Run-to-Run Control in Semiconductor Manufacturing2002 · 99 citations
Risk matrix input data biases2008 · 55 citations
Introduction to Statistical Process Control1997 · 50 citations
Applications of the upside-down normal loss function1996 · 24 citations
Statistical Methods for Industrial Process Control1998 · 22 citations

Works

5 shown

Risk matrix input data biases

Systems Engineering·2008·3 authors·Open access

55citations

Run-to-Run Control in Semiconductor Manufacturing

Journal of Quality Technology·2002·1 author

99citations

Statistical Methods for Industrial Process Control

Technometrics·1998·2 authors

22citations

Introduction to Statistical Process Control

Springer eBooks·1997·1 author·chapter

50citations

Applications of the upside-down normal loss function

IEEE Transactions on Semiconductor Manufacturing·1996·2 authors

24citations