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Peter Thomsen-Schmidt · Study

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Peter Thomsen-Schmidt

2 works· latest 2004· 1 institutionscluster: provisional

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Citations30

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Most cited in this library

Realisation and metrological characterisation of thickness standards below 100�nm2004 · 16 citations
Metrological characterization of nanometer film thickness standards for XRR and ellipsometry applications2003 · 14 citations

Works

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Realisation and metrological characterisation of thickness standards below 100�nm

Applied Physics A·2004·14 authors

16citations

Metrological characterization of nanometer film thickness standards for XRR and ellipsometry applications

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2003·10 authors·other

14citations