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Vincenzo Paciello

5 works· latest 2023· 2 institutionscluster: provisionalORCID 0000-0002-9284-1741

h-index5

i102

Citations58

Works here5

Most cited in this library

SmartCom Digital System of Units (D-SI) Guide for the use of the metadata-format used in metrology for the easy-to-use, safe, harmonised and unambiguous digital transfer of metrological data2019 · 27 citations
The Evaluation of Uncertainty in Measurements Using Artificial Neural Network Techniques2023 · 12 citations
Sensors uncertainty on an Android smart phone2012 · 7 citations
A universal metadata model for metrological complex quantities2020 · 6 citations
Measurement uncertainty on smart phone2013 · 6 citations

Works

5 shown

The Evaluation of Uncertainty in Measurements Using Artificial Neural Network Techniques

Annual Conference of the IEEE Industrial Electronics Society (IECON)·2023·6 authors·other

12citations

A universal metadata model for metrological complex quantities

IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT)·2020·3 authors·other

6citations

SmartCom Digital System of Units (D-SI) Guide for the use of the metadata-format used in metrology for the easy-to-use, safe, harmonised and unambiguous digital transfer of metrological data

Archivio Istituzionale della Ricerca - Università degli Studi di Cassino·2019·20 authors·other·Open access

27citations

Measurement uncertainty on smart phone

IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications (CIVEMSA)·2013·4 authors·other

6citations

Sensors uncertainty on an Android smart phone

IEEE International Instrumentation and Measurement Technology Conference·2012·2 authors·other

7citations