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Ian C. Vickridge · Study

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Ian C. Vickridge

1 works· latest 2004· 1 institutionscluster: provisionalORCID 0000-0002-1817-3378

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Critical review of the current status of thickness measurements for ultrathin SiO 2 on Si Part V: Results of a CCQM pilot study2004 · 141 citations

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Critical review of the current status of thickness measurements for ultrathin SiO 2 on Si Part V: Results of a CCQM pilot study

Surface and Interface Analysis·2004·34 authors

141citations