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Xuejian Wu · Study

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Xuejian Wu

2 works· latest 2013· 1 institutionscluster: provisionalORCID 0000-0002-5628-3607

h-index2

i101

Citations20

Works here2

10

13

Most cited in this library

Determining mean thickness of the oxide layer by mapping the surface of a silicon sphere2010 · 11 citations
Interferometric diameter determination of a silicon sphere using a traceable single laser frequency synthesizer2013 · 9 citations

Works

2 shown

Interferometric diameter determination of a silicon sphere using a traceable single laser frequency synthesizer

Measurement Science and Technology·2013·6 authors

9citations

Determining mean thickness of the oxide layer by mapping the surface of a silicon sphere

Optics Express·2010·5 authors·Open access

11citations