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C. M. Kao · Study
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Author
C. M. Kao
2 works
· latest 2012
· 1 institutions
cluster: provisional
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31
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Most cited in this library
Measuring the Manufacturing Yield for Processes With Multiple Manufacturing Lines
2011 · 19 citations
An Extension of the Product Acceptance Determination for One‐Sided Process with Multiple Characteristics
2012 · 12 citations
Works
2 shown
An Extension of the Product Acceptance Determination for One‐Sided Process with Multiple Characteristics
Quality and Reliability Engineering International
·
2012
·
4 authors
12
citations
Measuring the Manufacturing Yield for Processes With Multiple Manufacturing Lines
IEEE Transactions on Semiconductor Manufacturing
·
2011
·
3 authors
19
citations