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David Y.H. Pui · Study
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Author
David Y.H. Pui
4 works
· latest 2017
· 1 institutions
cluster: provisional
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Citations
573
Works here
4
91
05
06
17
Most cited in this library
Slip correction measurements of certified PSL nanoparticles using a nanometer differential mobility analyzer (nano-DMA) for Knudsen number from 0.5 to 83
2005 · 282 citations
Use of the electrostatic classification method to size 0.1 micrometer SRM particles - A feasibility study
1991 · 152 citations
Measurement of 100 nm and 60 nm Particle Standards by Differential Mobility Analysis
2006 · 101 citations
Characterization of nanosized silica size standards
2017 · 38 citations
Works
4 shown
Characterization of nanosized silica size standards
Aerosol Science and Technology
·
2017
·
7 authors
·
Open access
38
citations
Measurement of 100 nm and 60 nm Particle Standards by Differential Mobility Analysis
Journal of Research of the National Institute of Standards and Technology
·
2006
·
6 authors
·
Open access
101
citations
Slip correction measurements of certified PSL nanoparticles using a nanometer differential mobility analyzer (nano-DMA) for Knudsen number from 0.5 to 83
Journal of Research of the National Institute of Standards and Technology
·
2005
·
4 authors
·
Open access
282
citations
Use of the electrostatic classification method to size 0.1 micrometer SRM particles - A feasibility study
Journal of Research of the National Institute of Standards and Technology
·
1991
·
4 authors
·
Open access
152
citations