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emy of Forensic Sciences. James V. P. Conway is the senior document examiner in the San Francisco office of the U. S. Postal Inspection Service. Mr. Conway is a fellow in the American Academy of Forensic Sciences and a former chairman of its Document Section. He is the author of Evidential Documents (Charles C Thomas, 1959). Paul L. Kirk, Ph.D., is professor of criminalistics at the University of California, Berkeley. He is the author of Crime Investigation (Interscience Publishers, Inc., 1955) and has published a number of technical articles in this Journal and other publications.-EDITOR.
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Stored only when both papers are in the corpus — 17 citations exist upstream.
Papers that cite the same references — the relational fallback while embeddings are still backfilling.
Imported from OpenAlex (CC0) — nothing here is generated.