Comparison of trace elements analysis of nephrite samples from different deposits by PIXE and ICP‐AES

Abstract

Comparing values of trace elements determined by external‐beam proton‐induced X‐ray emission (PIXE) and inductively coupled plasma atomic emission spectrometry (ICP‐AES) is important to find the provenience of raw materials of ancient nephrite artifacts, because most previous elemental characterizations of nephrite minerals were obtained by ICP‐AES, but PIXE presents the possibility of nondestructive analysis for largely and integrally ancient nephrite artifacts. In this work based on 12 nephrite minerals, it shows that the distribution of trace elements of nephrite samples both in PIXE and ICP‐AES data are generally consistent, although large differences exist in some elements. According to the trace elements, the two types of nephrite mineralization origins can be distinguished, determined by PIXE and ICP‐AES, respectively. Moreover, depending on the PIXE and ICP‐AES data, Sr can be regarded as fingerprint element of Xiaomeiling nephrite minerals, and the differentiation of Sr content between Xiaomeiling nephrite minerals and ancient nephrite artifacts from Liangzhu culture (3300–2300 bc ) is clear evidence that the raw materials of the artifacts are not from Xiaomeiling deposit. The nephrite minerals from Wenchuan deposit can be distinguished from other samples because of their high values of Mn/Fe. Therefore, the PIXE can be used with ICP‐AES to judge mineralization mechanism and find fingerprint elements of raw materials of ancient nephrite artifacts. Copyright © 2012 John Wiley & Sons, Ltd.

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