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Yield and Reliability in Microwave Circuit and System Design · Study

BookYield and Reliability in Microwave Circuit and System Design

Michael Meehan1993

Book1993

Yield and Reliability in Microwave Circuit and System Design

Michael Meehan · John E. Purviance

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Probabilistic and Robust Engineering Design Microwave Engineering and Waveguides VLSI and Analog Circuit Testing

Abstract

Yield calculating yield statistical sensitivity yield optimization statistical modeling case studies and examples.

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2000Nonlinear Statistical Modeling and Yield Estimation Technique for Use in Monte Carlo Simulations

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Year1993

Typebook

Published1993-12-01

Languageen

Citations38

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ShelfProbabilistic and Robust Engineering Design

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openalex_workW1548867998

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