A Nonparametric Bayes Empirical Bayes Procedure for Estimating the Percent Nonconforming in Accepted Lots

Abstract

An estimator is presented for estimating the percentage of nonconforming product in lots accepted under a zero-defect acceptance sampling plan. Extensions to the case of a c-defect acceptance sampling criterion are also considered. Both point and probability interval estimators are presented. A limited Monte Carlo simulation is used to examine the Bayes risk of this and another estimator. The estimator presented here is observed to possess excellent Bayes risk performance in the zero-defects case.

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