Control Schemes for Low Count Levels

James M. Lucas

43 citations0/0 files storedJournal of Quality Technology

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Advanced Statistical Process Monitoring Management and Optimization Techniques Fault Detection and Control Systems

Abstract

The control of counts (this usually means defects) which occur at very low levels is discussed. Very low count levels can be below the range of counts covered in a previous article on Counted Data CUSUMS. In this era of improved quality and increasing quality awareness, very low count regimes are important. This paper describes two practical procedures for the control of low count levels and tells when they should be used. Because both schemes can be represented as CUSUM schemes, it is easy to develop their properties. In particular, the Average Run Length (ARL) for these procedures is given, where the ARL is the average number of samples taken before an out-of-control signal occurs.

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References

1972An Approach to the Probability Distribution of Cusum Run Length 1987Exact Results for Shewhart Control Charts With Supplementary Runs Rules 1985Counted Data CUSUM's 1982Fast Initial Response for CUSUM Quality-Control Schemes: Give Your CUSUM A Head Start 1955CONTROL CHARTS WITH WARNING LINES

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1998A comparative study of CCC and CUSUM charts 2008A binomial CUSUM chart for detecting large shifts in fraction nonconforming 2006Detecting improvement using Shewhart attribute control charts when the lower control limit is zero 2014Binomial CUSUM chart with curtailment 2013An optimisation design of the combined np-CUSUM scheme for attributes 2011A new adaptive control chart for monitoring process mean and variability 1998Effects of correlation on fraction non-conforming statistical process control procedures 2013Properties and performance of one-sided cumulative count of conforming chart with parameter estimation in high-quality processes

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