Latent Structures-Based Multivariate Statistical Process Control: A Paradigm Shift

Abstract

The basic fundamentals of statistical process control (SPC) were proposed by Walter Shewhart for data-starved production environments typical in the 1920s and 1930s. In the 21st century, the traditional scarcity of data has given way to a data-rich environment typical of highly automated and computerized modern processes. These data often exhibit high correlation, rank deficiency, low signal-to-noise ratio, multistage and multiway structures, and missing values. Conventional univariate and multivariate SPC techniques are not suitable in these environments. This article discusses the paradigm shift to which those working in the quality improvement field should pay keen attention. We advocate the use of latent structure–based multivariate statistical process control methods as efficient quality improvement tools in these massive data contexts. This is a strategic issue for industrial success in the tremendously competitive global market.

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