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This paper amplifies the distinction between Type A and Type B sampling plans for individual lots and processes, respectively. It introduces the f-binomial distribution as a Poisson type finite analog to the hypergeometric distribution for use in constructing appropriate Type A OC curves for defects. The use of average run length in characterizing Type B sampling plans is also presented as a missing measure in the evaluation of such plans.
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Stored only when both papers are in the corpus — 20 citations exist upstream.
Papers that cite the same references — the relational fallback while embeddings are still backfilling.
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