Article2003

Measurement repetitions of the Si(220) lattice spacing

Giovanni Cavagnero · G. Mana · E. Massa · G. Zosi

30 citations0/0 files storedMetrologia

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Scientific Measurement and Uncertainty Evaluation X-ray Diffraction in Crystallography Advanced Measurement and Metrology Techniques

Abstract

This paper presents the results of measurements carried out at the Istituto di Metrologia ‘G Colonnetti’ (IMGC) and the National Metrology Institute of Japan (NMIJ) in order to investigate the disagreement between the respective past determinations of the (220) lattice spacing of Si. A bug in the past IMGC experiment has been identified and eliminated. The discrepancy having been removed, improved lattice spacing values are given. Basically, these values confirm the NMIJ determination but not the IMGC one.

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References

1995Guide to the Expression of Uncertainty in Measurement 1999CODATA Recommended Values of the Fundamental Physical Constants: 1998 1971Precision measurement and fundamental constants 2003Determination of the Avogadro constant via the silicon route 2001History and progress in the accurate determination of the Avogadro constant 1994Measurement of the silicon (220) lattice spacing 1999Determination of the Avogadro constant by accurate measurement of the molar volume of a silicon crystal 1995A new determination of N/sub A/

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2011Homogeneity characterization of lattice spacing of silicon single crystals by a self-referenced lattice comparator 2007Confirmation of the INRiM and PTB Determinations of the Si Lattice Parameter 2015Progress on accurate measurement of the Planck constant: Watt balance and counting atoms 2005Precise lattice parameter comparison of highly perfect silicon crystals 2020The Measurement of the Silicon Lattice Parameter and the Count of Atoms to Realise the Kilogram

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