A fraction defective based capability index

Abstract

Abstract Two problems greatly affect the use of capability indices such as $C_p$ , $C_{pk}$ and $C_{pkm}$ : the lack of affinity with the process fraction defective π and the difficulty of dealing with the sampling distributions of their natural estimators. In this paper, a capability index which is in one‐to‐one correspondence with π is introduced and simple inferential procedures under a Bayesian perspective are developed to facilitate its use in industrial applications. Copyright © 2001 John Wiley & Sons, Ltd.

Cite this work

No public copy is stored for this record, so only the metadata is cited.

Stored only when both papers are in the corpus — 41 citations exist upstream.

Papers that cite the same references — the relational fallback while embeddings are still backfilling.