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Constructing the OGE for promoting tool group productivity in semiconductor manufacturing
7 references·1 citing·29 second hop
Constructing the OGE for promoting tool group productivity in semiconductor manufacturing (2007)Constructing the OGE for promoting tool g…Equipment Effectiveness: OEE Revisited (2005)Equipment Effectiveness: OEE …Manufacturing productivity improvement using effectiveness metrics and simulation analysis (2003)Manufacturing productivity im…Design of a sampling strategy for measuring and compensating for overlay errors in semiconductor manufacturing (2003)Design of a sampling strategy…Data value development to enhance competitive advantage: a retrospective study of EDA systems for semiconductor fabrication (2003)Data value development to enh…From overall equipment efficiency (OEE) to overall Fab effectiveness (OFE) (2002)From overall equipment effici…Operational efficiency and effectiveness measurement (2001)Operational efficiency and ef…Factory Physics : Foundations of Manufacturing Management (1995)Factory Physics : Foundations…Inventory write-down prediction for semiconductor manufacturing considering inventory age, accounting principle, and product structure with real settings (2011)Inventory write-down predicti…Measurement of overall equipment effectiveness as a basis for TPM activities (1998)Cross‐functional team working for overall equipment effectiveness (OEE) (2003)An evaluation of TPM implementation initiatives in an Indian manufacturing enterprise (2007)Total Productive Maintenance (TPM) Implementation in a Machine Shop: A Case Study (2013)Modeling and analysis of manufacturing systems (2016)Optimal Policies for a Multi-Echelon Inventory Problem (1960)The Bullwhip Effect In Supply Chains 1 (1997)Optimal Policies for a Multi-Echelon Inventory Problem (2004)Optimal production-delivery policy for a vendor-buyers integrated system considering postponed simultaneous delivery (2016)An empirical study of demand forecasting of non-volatile memory for smart production of semiconductor manufacturing (2018)Discrete-Event System Simulation (1984)Introduction to TPM : total productive maintenance (1988)Evaluation of overall line effectiveness (OLE) in a continuous product line manufacturing system (2006)Overall throughput effectiveness (OTE) metric for factory-level performance monitoring and bottleneck detection (2006)FUZZY COPRAS METHOD FOR PERFORMANCE MEASUREMENT IN TOTAL PRODUCTIVE MAINTENANCE: A COMPARATIVE ANALYSIS (2016)Performance measurement and performance management (1995)The performance measurement revolution: why now and what next? (1999)OEEand equipment effectiveness: an evaluation (2006)Overall equipment effectiveness of a manufacturing line (OEEML) (2008)Overall Equipment Effectiveness: Systematic Literature Review and Overview of Different Approaches (2020)Evaluation of overall equipment effectiveness in the beverage industry: a case study (2012)Overall Equipment Effectiveness (OEE) Calculation - Automation through Hardware & Software Development (2013)From measuring overall equipment effectiveness (OEE) to overall resource effectiveness (ORE) (2015)On theory in operations management (1998)An exploration towards a production theory and its application to construction (2000)The four roles of supply chain management in construction (2000)Advanced Quality Control (AQC) of Silicon Wafer Specifications for Yield Enhancement for Smart Manufacturing (2020)A UNISON framework for analyzing alternative strategies of IC final testing for enhancing overall operational effectiveness (2006)Which types of leadership styles do followers prefer? A decision tree approach (2017)
this work references cited by second hop

References

  • 1995Factory Physics : Foundations of Manufacturing Management1,349 cited
  • 2001Operational efficiency and effectiveness measurement232 cited
  • 2003Manufacturing productivity improvement using effectiveness metrics and simulation analysis194 cited
  • 2005Equipment Effectiveness: OEE Revisited118 cited
  • 2002From overall equipment efficiency (OEE) to overall Fab effectiveness (OFE)100 cited
  • 2003Design of a sampling strategy for measuring and compensating for overlay errors in semiconductor manufacturing36 cited
  • 2003Data value development to enhance competitive advantage: a retrospective study of EDA systems for semiconductor fabrication25 cited

Cited by

  • 2011Inventory write-down prediction for semiconductor manufacturing considering inventory age, accounting principle, and product structure with real settings21 cited

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