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Progress toward Système International d'Unités traceable force metrology for nanomechanics
2 references·12 citing·27 second hop
Progress toward Système International d'Unités traceable force metrology for nanomechanics (2004)Progress toward Système International d'U…Accurate Measurement of the Planck Constant (1998)Accurate Measurement of the P…Determination of the volt with the improved PTB voltage balance (1991)Determination of the volt wit…Development of a New Apparatus for SI Traceable Small Mass Measurements Using the Voltage Balance Method at NMIJ (2020)Development of a New Apparatu…Traceable measurements of small forces and local mechanical properties (2011)Traceable measurements of sma…Atomic force microscope cantilever flexural stiffness calibration: Toward a standard traceable method (2011)Atomic force microscope canti…Traceability in hardness measurements: from the definition to industry (2010)Traceability in hardness meas…Review of low force transfer artefact technologies. (2008)Review of low force transfer …Microforce materials tester based on the levitation mass method (2007)Microforce materials tester b…Method of generating and measuring static small force using down-slope component of gravity (2007)Method of generating and meas…Alignment uncertainties in ideal indentation styli (2007)Alignment uncertainties in id…SI-Traceable Spring Constant Calibration of Microfabricated Cantilevers for Small Force Measurement (2006)SI-Traceable Spring Constant …Atomic force microscope cantilever calibration device for quantified force metrology at micro- or nano-scale regime: the nano force calibrator (NFC) (2006)Atomic force microscope canti…Microforce materials tester (2005)Microforce materials testerMethod for generating and measuring the micro-Newton level forces (2005)Method for generating and mea…A method for calibrating force transducers against oscillation force (2003)Proposal for a step response evaluation method for force transducers (2003)The NIST microforce realization and measurement project (2003)A Realization of the SI Watt by the NPL Moving-coil Balance (1990)Determination of the Electron's Atomic Mass and the Proton/Electron Mass Ratio via Penning Trap Mass Spectroscopy (1995)Towards an electronic kilogram: an improved measurement of the Planck constant and electron mass (2005)CODATA recommended values of the fundamental physical constants: 2006 (2008)CODATA Recommended Values of the Fundamental Physical Constants: 2010 (2012)Accurate analytical measurements in the atomic force microscope: a microfabricated spring constant standard potentially traceable to the SI (2003)Guide to the Expression of Uncertainty in Measurement (1995)GUIDE TO THE EXPRESSION OF UNCERTAINTY IN MEASUREMENT (2006)SI-traceable determination of spring constants of various atomic force microscope cantilevers with a small uncertainty of 1% (2007)A new facility to realize a nanonewton force standard based on electrostatic methods (2009)Current state of the art in small mass and force metrology within the International System of Units (2018)Springer Handbook of Materials Measurement Methods (2006)Investigation of the comparison method for the dynamic calibration of force transducers (1998)Measurement of the electrical and mechanical responses of a force transducer against impact forces (2006)Toward dynamic force calibration (2009)Toward Establishing Dynamic Calibration Method for Force Transducers (2009)Review of SI traceable force metrology for instrumented indentation and atomic force microscopy (2005)Guidelines for evaluating and expressing the uncertainty of NIST measurement results (2018)News from the BIPM (1989)The Route to Atomic and Quantum Standards (2004)Determination of the Planck constant by means of a watt balance (2009)Prototype cantilevers for SI-traceable nanonewton force calibration (2006)A compact torsional reference device for easy, accurate and traceable AFM piconewton calibration (2013)Impact response measurement of an accelerometer (2006)
this work references cited by second hop

References

  • 1998Accurate Measurement of the Planck Constant162 cited
  • 1991Determination of the volt with the improved PTB voltage balance77 cited

Cited by

  • 2006Atomic force microscope cantilever calibration device for quantified force metrology at micro- or nano-scale regime: the nano force calibrator (NFC)53 cited
  • 2005Microforce materials tester46 cited
  • 2005Method for generating and measuring the micro-Newton level forces35 cited
  • 2011Atomic force microscope cantilever flexural stiffness calibration: Toward a standard traceable method28 cited
  • 2007Method of generating and measuring static small force using down-slope component of gravity24 cited
  • 2010Traceability in hardness measurements: from the definition to industry20 cited
  • 2007Microforce materials tester based on the levitation mass method19 cited
  • 2006SI-Traceable Spring Constant Calibration of Microfabricated Cantilevers for Small Force Measurement18 cited
  • 2008Review of low force transfer artefact technologies.12 cited
  • 2007Alignment uncertainties in ideal indentation styli11 cited
  • 2011Traceable measurements of small forces and local mechanical properties10 cited
  • 2020Development of a New Apparatus for SI Traceable Small Mass Measurements Using the Voltage Balance Method at NMIJ

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10 cited