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Depth resolved ion beam analysis of objects of art · Study

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ArticleDepth resolved ion beam analysis of objects of art

Christian Neelmeijer1996

Article1996

Depth resolved ion beam analysis of objects of art

Christian Neelmeijer · Wolfgang Wagner · Hans-Peter Schramm

58 citations·0/0 files stored·Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

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Cultural Heritage Materials Analysis Ion-surface interactions and analysis X-ray Spectroscopy and Fluorescence Analysis

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2009Composition of Renaissance Paint Layers: Simultaneous Particle Induced X-ray Emission and Backscattering Spectrometry 2005Differential PIXE for investigating the layer structure of paintings 2002The merits of particle induced X-ray emission in revealing painting techniques 2021Detectors and Cultural Heritage: The INFN-CHNet Experience 20073D Micro PIXE—a new technique for depth-resolved elemental analysis 2012Potential consequences of ion beam analysis on objects from our cultural heritage: An appraisal 2009Differential and scanning-mode external PIXE for the analysis of the painting “Ritratto Trivulzio” by Antonello da Messina 2010New approaches for investigating paintings by ion beam techniques

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Year1996

Typearticle

Published1996-09-01

VenueNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

ISSN-L0168-583X

Languageen

Citations58

Files0 public / 0

ShelfCultural Heritage Materials Analysis

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doi10.1016/0168-583x(95)01193-5

openalex_workW1987152091

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