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Abstract Double sampling (DS) $\overline{X}$ ‐control charts are designed to allow quick detection of a small shift of process mean and provides a quick response in an agile manufacturing environment. However, the DS $\overline{X}$ ‐control charts assume that the process standard deviation remains unchanged throughout the entire course of the statistical process control. Therefore, a complementary DS chart that can be used to monitor the process variation caused by changes in process standard deviation should be developed. In this paper, the development of the DS s‐charts for quickly detecting small shift in process standard deviation for agile manufacturing is presented. The construction of the DS s‐charts is based on the same concepts in constructing the DS $\overline{X}$ ‐charts and is formulated as an optimization problem and solved with a genetic algorithm. The efficiency of the DS s‐control chart is compared with that of the traditional s‐control chart. The results show that the DS s‐control charts can be a more economically preferable alternative in detecting small shifts than traditional s‐control charts. Copyright © 2002 John Wiley & Sons, Ltd.
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