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ArticleCpk applications—Uses and abuses

Ronald P. Anjard1991

Article1991

Cpk applications—Uses and abuses

Ronald P. Anjard · Gary K. Griffith · Shin-Ta Liu · D.A. Pasfield

5 citations·0/0 files stored·Microelectronics Reliability

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Advanced Statistical Process Monitoring Management and Optimization Techniques Management Systems and Quality Improvement

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References

1986Process Capability Indices 1995Process Capability Indices.1988A New Measure of Process Capability:Cpm 1989Process Capability Calculations for Non-Normal Distributions 1989Statistical Process Control Methods for Long and Short Runs

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Details

Year1991

Typearticle

Published1991-01-01

VenueMicroelectronics Reliability

ISSN-L0026-2714

Languageen

Citations5

Files0 public / 0

ShelfAdvanced Statistical Process Monitoring

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doi10.1016/0026-2714(91)90301-m

openalex_workW1997622208

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