Bayesian tolerance interval control limits for attributes

Abstract

Abstract The probability content of standard control limits for attributes can vary because distribution parameters that appear in the control limits are estimated based on previous data. This paper proposes using Bayesian tolerance interval control limits which control the probability content at a specified level with a given confidence. Bayesian tolerance interval control limits are developed for np, p, c and u charts and are illustrated with four examples from the literature. Moreover, Bayesian tolerance interval control limits can be used for processes at start‐up. Published in 2002 by John Wiley & Sons, Ltd.

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