SZodixStudyAcademic Library
ShelvesOpen access
Study · an open academic library·Metadata from OpenAlex (CC0)·Shelves·OpenAlex metadata, de-duplicated
Design of a sampling strategy for measuring and compensating for overlay errors in semiconductor manufacturing
0 references·2 citing·7 second hop
Design of a sampling strategy for measuring and compensating for overlay errors in semiconductor manufacturing (2003)Design of a sampling strategy for measuri…Advanced Quality Control (AQC) of Silicon Wafer Specifications for Yield Enhancement for Smart Manufacturing (2020)Advanced Quality Control (AQC…Constructing the OGE for promoting tool group productivity in semiconductor manufacturing (2007)Constructing the OGE for prom…Factory Physics : Foundations of Manufacturing Management (1995)Operational efficiency and effectiveness measurement (2001)Manufacturing productivity improvement using effectiveness metrics and simulation analysis (2003)Inventory write-down prediction for semiconductor manufacturing considering inventory age, accounting principle, and product structure with real settings (2011)A system for online detection and classification of wafer bin map defect patterns for manufacturing intelligence (2013)UNISON data-driven intermittent demand forecast framework to empower supply chain resilience and an empirical study in electronics distribution (2019)Deep reinforcement learning for selecting demand forecast models to empower Industry 3.5 and an empirical study for a semiconductor component distributor (2020)
this work references cited by second hop

References

No references inside the corpus for this window.

Cited by

  • 2007Constructing the OGE for promoting tool group productivity in semiconductor manufacturing49 cited
  • 2020Advanced Quality Control (AQC) of Silicon Wafer Specifications for Yield Enhancement for Smart Manufacturing35 cited

Only edges whose both ends are imported exist here. Widen the year window, or show the whole map. Back to the work