Modified Shewhart Charts for High Yield Processes

T. C. Chang · Fah Fatt Gan

22 citations0/0 files storedJournal of Applied Statistics

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Advanced Statistical Process Monitoring Fault Detection and Control Systems Management Systems and Quality Improvement

Abstract

The conventional Shewhart p or np chart is not effective for monitoring a high yield process, a process in which the defect level is close to zero. An improved Shewhart np chart for monitoring high yield processes is proposed. A review of control charts for monitoring high yield processes is first given. The run length performance of the proposed Shewhart chart is then compared with other high yield control charts. A simple procedure for designing the chart for processes subjected to sampling or 100% continuous inspection is provided and this allows the chart to be implemented easily on the factory floor. The practical aspects of implementation of the Shewhart chart are discussed. An application of the Shewhart chart based on a real data set is demonstrated.

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1992Introduction to Statistical Quality Control 1967Quality Control and Industrial Statistics.1972An Approach to the Probability Distribution of Cusum Run Length 1990Statistical Quality Control 2001Introduction to Statistical Quality Control 2012Statistical Process Control 1987Exact Results for Shewhart Control Charts With Supplementary Runs Rules 1989Statistical Quality Control

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2021Statistical design of phase II exponential chart with estimated parameters under the unconditional and conditional perspectives using exact distribution of median run length 2017Control charts for monitoring correlated counts with a finite range 2011A Sequential Bayesian Cumulative Conformance Count Approach to Deterioration Detection in High Yield Processes 2013Change point estimation of high-yield processes with a linear trend disturbance 2016Performance comparison for the CRL control charts with estimated parameters for high-quality processes

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