Variable sampling inspection plans with screening indexed by Taguchi’s quality loss for optimising average total inspection

Abstract

There are some conventional attribute sampling inspection plans designed with respect to attribute property, such as the proportion of nonconforming items. Among them, the attribute sampling inspection plans with screening are defined under the lot tolerance percent defective (LTPD) inspection scheme and the average outgoing quality limit (AOQL) inspection scheme. On one hand, Taguchi has proposed the concept of quality loss as a measure to evaluate the quality of items based on the variable property instead of the traditional attribute quality evaluation. Hereby, in this article, the design procedures for variable sampling inspection plans with screening indexed by Taguchi’s quality loss in conformity with the conventional attribute sampling inspection plans with screening composed of the LTPD and AOQL inspection schemes are represented.

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