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Testing capability indices for one-sided processes with measurement errors
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Testing capability indices for one-sided processes with measurement errors (2013)Testing capability indices for one-sided …Process Yield, Process Centering and Capability Indices for One-Sided Tolerance Processes (2012)Process Yield, Process Center…New Process Capability Indices for One-Sided Tolerances (2009)New Process Capability Indice…Estimating and Testing Process Precision with Presence of Gauge Measurement Errors (2007)Estimating and Testing Proces…Measuring process capability based on Cpmk with gauge measurement errors (2006)Measuring process capability …Testing process capability based onCpmin the presence of random measurement errors (2005)Testing process capability ba…One-sided Process Capability Assessment in the Presence of Measurement Errors (2005)One-sided Process Capability …Measuring process capability based on CPK with gauge measurement errors (2004)Measuring process capability …Capability indices for processes with asymmetric tolerances (2001)Capability indices for proces…Measurement Error Effects on the Performance of Process Capability Indices (1997)Measurement Error Effects on …A uniformed approach to capability indices (1995)A uniformed approach to capab…Distributional and Inferential Properties of Process Capability Indices (1992)Distributional and Inferentia…A New Measure of Process Capability:Cpm (1988)A New Measure of Process Capa…Quality-Control Handbook. (1952)Process Capability Indices (1986)Brocess capability with asymmetric tolerances (1994)Process Capability Indices. (1995)Process Capability Indices—A Review, 1992–2000 (2002)An overview of theory and practice on process capability indices for quality assurance (2008)Introduction to Statistical Quality Control (1992)Using a novel approach to assess process performance in the presence of measurement errors (2010)Generalized Inference for Measuring Process Yield With the Contamination of Measurement Errors—Quality Control for Silicon Wafer Manufacturing Processes in the Semiconductor Industry (2011)Multivariate process capability using principal component analysis in the presence of measurement errors (2011)The Taguchi Capability Index (1991)ESTIMATION OFCpFOR AUTOCORRELATED DATA AND MEASUREMENT ERRORS (2002)Integrated process capability analysis with an application in backlight module (2002)Fuzzy process capability indices with asymmetric tolerances (2011)New process yield index of asymmetric tolerances for bootstrap method and six sigma approach (2019)Manufacturing process performance evaluation for fuzzy data based on loss-based capability index (2011)Capability measurement of size-exclusion chromatography with a light-scattering detection method in a stability study of bevacizumab using the process capability indices (2014)Quality Control - Intelligent Manufacturing, Robust Design and Charts (2020)Fuzzy assessment model to judge quality level of machining processes involving bilateral tolerance using crisp data (2020)Capability assessment for processes with multiple characteristics: A generalization of the popular index Cpk (2011)Designing a variables two-plan sampling system of type TNTVSS-(nT,nN;k) for controlling process fraction nonconforming with unilateral specification limit (2014)A Sampling Scheme for Resubmitted Lots Based on One-Sided Capability Indices (2015)UNIVARIATE PROCESS CAPABILITY INDICES FOR UNILATERAL SPECIFICATION REGION — A REVIEW AND SOME MODIFICATIONS (2012)Process Selection for Linear Profiles with One‐sided Specifications Based on the Ratio Test Statistic (2014)Multivariate Process Capability Index Based on Data Depth Concept (2016)Computing process capability indices for non-normal data: a review and comparative study (1999)Statistical testing for assessing the performance of lifetime index of electronic components with exponential distribution (2002)Capability measures for processes with multiple characteristics (2003)
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References

  • 1988A New Measure of Process Capability:Cpm768 cited
  • 1992Distributional and Inferential Properties of Process Capability Indices700 cited
  • 1995A uniformed approach to capability indices170 cited
  • 2001Capability indices for processes with asymmetric tolerances56 cited
  • 2004Measuring process capability based on CPK with gauge measurement errors47 cited
  • 1997Measurement Error Effects on the Performance of Process Capability Indices44 cited
  • 2005One-sided Process Capability Assessment in the Presence of Measurement Errors39 cited
  • 2005Testing process capability based onCpmin the presence of random measurement errors32 cited
  • 2006Measuring process capability based on Cpmk with gauge measurement errors26 cited
  • 2009New Process Capability Indices for One-Sided Tolerances22 cited
  • 2012Process Yield, Process Centering and Capability Indices for One-Sided Tolerance Processes20 cited
  • 2007Estimating and Testing Process Precision with Presence of Gauge Measurement Errors19 cited

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