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An Extension of the Product Acceptance Determination for One‐Sided Process with Multiple Characteristics
13 references·1 citing·40 second hop
An Extension of the Product Acceptance Determination for One‐Sided Process with Multiple Characteristics (2012)An Extension of the Product Acceptance De…Capability assessment for processes with multiple characteristics: A generalization of the popular index Cpk (2011)Capability assessment for pro…Two‐dimensional guidelines for measurement system indices (2010)Two‐dimensional guidelines fo…The development of a target‐focused process capability index with multiple characteristics (2010)The development of a target‐f…Multiresponse optimization using multivariate process capability index (2010)Multiresponse optimization us…Developing a sampling plan based on Cpk—unknown variance (2010)Developing a sampling plan ba…A bibliography of the literature on process capability indices: 2000–2009 (2010)A bibliography of the literat…Photolithography Control in Wafer Fabrication Based on Process Capability Indices With Multiple Characteristics (2009)Photolithography Control in W…Measuring production yield for processes with multiple characteristics (2009)Measuring production yield fo…Sample size determination for production yield estimation with multiple independent process characteristics (2008)Sample size determination for…An overview of theory and practice on process capability indices for quality assurance (2008)An overview of theory and pra…Measuring manufacturing capability for couplers and wavelength division multiplexers (2004)Measuring manufacturing capab…Critical acceptance values and sample sizes of a variables sampling plan for very low fraction of defectives (2004)Critical acceptance values an…Process Capability Indices—A Review, 1992–2000 (2002)Process Capability Indices—A …Implementing EWMA Yield Index for Simple Linear Profiles with One-sided Specifications in Product Acceptance Determination (2016)Implementing EWMA Yield Index…Quality Control and Industrial Statistics (1988)Developing a Sampling Plan Based onCpk (2009)Design and Construction of a Variables Repetitive Group Sampling Plan for Unilateral Specification Limit (2013)A flexible process-capability-qualified resubmission-allowed acceptance sampling scheme (2014)A modified variables repetitive group sampling plan with the consideration of preceding lots information (2015)Process Capability Indices (1986)The Taguchi Capability Index (1991)Process Capability Indices. (1995)Supplier Selection for Multiple-Characteristics Processes with One-Sided Specifications (2013)Monitoring high complex production processes using process capability indices (2017)Optimal design of overall yield-based variable repetitive sampling plans for processes with multiple characteristics (2019)Introduction to Statistical Quality Control (1992)Multiple Dependent State Sampling Plan Based on Process Capability Index (2013)A resubmitted sampling scheme by variables inspection for controlling lot fraction nonconforming (2014)Multiple dependent state variable sampling plans with process loss consideration (2014)Quality-Control Handbook. (1952)Variables sampling inspection scheme for resubmitted lots based on the process capability index Cpk (2011)Variable sampling inspection for resubmitted lots based on process capability index Cpk for normally distributed items (2012)Continuous improvement competence, employee creativity, and new service development performance: A frontline employee perspective (2015)Distributional and Inferential Properties of Process Capability Indices (1992)Brocess capability with asymmetric tolerances (1994)Process-Quality Evaluation for Wire Bonding With Multiple Gold Wires (2020)Simultaneous Optimization of Several Response Variables (1980)Quality Engineering Using Robust Design (1990)Design and Analysis of Experiments (2005)A Close Form Solution for the Product Acceptance Determination Based on the Popular Index Cpk (2012)A Note on “Capability Assessment for Processes with Multiple Characteristics: A Generalization of the Popular Index Cpk” (2012)An Integrated Approach Based on Principal Component and Multivariate Process Capability for Simultaneous Optimization of Location and Dispersion for Correlated Multiple Response Problems (2013)A New Measure of Process Capability:Cpm (1988)Supplier selection for one-sided processes with unequal sample sizes (2008)Yield-Based Capability Index for Evaluating the Performance of Multivariate Manufacturing Process (2013)A Bibliography of Process Capability Papers (2003)Designing of X-bar control charts based on process capability index using repetitive sampling (2013)On the distribution of the estimated process yield index Spk (2002)Capability measures for processes with multiple characteristics (2003)Generalized Inference for Measuring Process Yield With the Contamination of Measurement Errors—Quality Control for Silicon Wafer Manufacturing Processes in the Semiconductor Industry (2011)Measuring the Manufacturing Yield for Processes With Multiple Manufacturing Lines (2011)Juran's Quality Control Handbook (1990)An effective decision making method for product acceptance (2005)A variables sampling plan based on Cpmk for product acceptance determination (2007)
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References

  • 2002Process Capability Indices—A Review, 1992–2000511 cited
  • 2008An overview of theory and practice on process capability indices for quality assurance343 cited
  • 2010A bibliography of the literature on process capability indices: 2000–2009153 cited
  • 2004Critical acceptance values and sample sizes of a variables sampling plan for very low fraction of defectives100 cited
  • 2010Developing a sampling plan based on Cpk—unknown variance49 cited
  • 2009Measuring production yield for processes with multiple characteristics43 cited
  • 2011Capability assessment for processes with multiple characteristics: A generalization of the popular index Cpk37 cited
  • 2004Measuring manufacturing capability for couplers and wavelength division multiplexers32 cited
  • 2010Multiresponse optimization using multivariate process capability index30 cited
  • 2009Photolithography Control in Wafer Fabrication Based on Process Capability Indices With Multiple Characteristics25 cited
  • 2010The development of a target‐focused process capability index with multiple characteristics23 cited
  • 2010Two‐dimensional guidelines for measurement system indices23 cited
  • 2008Sample size determination for production yield estimation with multiple independent process characteristics14 cited

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Implementing EWMA Yield Index for Simple Linear Profiles with One-sided Specifications in Product Acceptance Determination
11 cited