Article2010

New acceptance sampling plans based on life tests for Birnbaum–Saunders distributions

Muhammad Aslam · Chi‐Hyuck Jun · Munir Ahmad

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Advanced Statistical Process Monitoring Reliability and Maintenance Optimization Statistical Distribution Estimation and Applications

Abstract

In this paper, we consider the Birnbaum–Saunders distribution as a life model to develop various acceptance sampling schemes based on the truncated life tests. We develop the double sampling plan and determine the design parameters satisfying both the producer's and consumer's risks simultaneously for the specified reliability levels in terms of the mean ratio to the specified life. We also propose a group sampling plan and determine the parameters by the above-mentioned two-point method. Tables are constructed for the proposed sampling plans and results are explained with examples.

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References

2007Acceptance Sampling Plans from Truncated Life Tests Based on the Generalized Birnbaum–Saunders Distribution 2006Acceptance sampling based on truncated life tests for generalized Rayleigh distribution 2006Variables Sampling Plans for Weibull Distributed Lifetimes Under Sudden Death Testing 2010Time truncated acceptance sampling plans for generalized exponential distribution 2010A double acceptance sampling plan for generalized log-logistic distributions with known shape parameters

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2020Double and group acceptance sampling plan for truncated life test based on inverse log-logistic distribution 2012FUZZY ACCEPTANCE SAMPLING AND CHARACTERISTIC CURVES 2017Acceptance sampling plans for inverse Weibull distribution based on truncated life test 2020Economic design of repetitive group sampling plan based on truncated life test under Birnbaum–Saunders distribution 2018Optimal design of repetitive group sampling plans for Weibull and gamma distributions with applications and comparison to the Birnbaum–Saunders distribution 2015Acceptance sampling plans for multi-stage process based on time-truncated test for Weibull distribution 2015Sampling Plans Based on Truncated Life Test for a Generalized Inverted Exponential Distribution

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