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Lock-in amplifiers are widely used in metrology to extract a sinusoidal component of a known frequency from a signal that is noisy, returning estimates of the amplitude and phase of the component. A number of questions arise regarding the use by metrologists of the results returned by a lock-in amplifier. For example, what uncertainties should be associated with the estimates returned? How do these uncertainties vary as the signal-to-noise ratio changes? How do instrument errors affect the estimates and the associated uncertainties? In this paper a software simulation tool is described that may be used to process simulated or real (measured) signals, with the user allowed to associate uncertainties with the values of parameters that define the simulated signal and with those that define the operation of the instrument. The results of applying the software simulation tool to both simulated signals and real signals from infrared radiation and nanoindentation experiments are described.
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Papers that cite the same references — the relational fallback while embeddings are still backfilling.
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