Some Remarks on the Bayesian Solution of the Single Sample Inspection Scheme

Abstract

Batches of items, assumed independent of one another, are to be sentenced using an acceptance sampling plan based upon a random sample of size n and an acceptance number cn Granting that the prior distribution of the probability of a defective item is a mixed binomial distribution, and using a simple cost criteria, a rapid technique is proposed for computing n and cn . The method appears robust over wide changes in the parameters of the model.

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