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Abstract We present a case study in monitoring a high‐volume production process with a high yield. Testing the products is difficult and is only possible in a destructive way with a defect/no‐defect result. We review several attribute charting procedures for high‐yield processes. It turns out that monitoring the number of conforming items between the occurrence of non‐conforming items is appropriate. We discuss several implementation aspects of CCCr charts in our case study. The implementation is based on a new formula for the standard deviation of the number of inspected items before a signal. Copyright © 2005 John Wiley & Sons, Ltd.
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