An Improved Group Sampling Plan Based on Time-Truncated Life Tests

Abstract

In this paper, a new group sampling plan for the lot acceptance is proposed for the time truncated life test, which can be utilized when multi-item testers are implemented. The design parameters are found using the two-point approach such that the producer's and consumer's risks are satisfied simultaneously at the acceptable reliability level and the lot tolerance reliability level, respectively. The case of Weibull distribution is described to illustrate the procedure that can be used when the quality level is expressed by a multiple of the specified life. The advantage of the proposed plan is demonstrated by comparing with the existing plan in terms of the sample size required. The tables are constructed and some examples are given to illustrate the procedure developed here.

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