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Abstract Much of the information in micromorphological thin sections exists at the mesoscopic level. The use of flatbed scanners can improve analysis at this level and aid in preservation of the information. This article describes scanning in both plane and cross‐polarized light and discusses the hardware and software required. © 2002 Wiley Periodicals, Inc.
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Stored only when both papers are in the corpus — 63 citations exist upstream.
Papers that cite the same references — the relational fallback while embeddings are still backfilling.
Imported from OpenAlex (CC0) — nothing here is generated.