Optimal control limits for CCC charts in the presence of inspection errors

Min Xie · T. N. Goh

28 citations0/0 files storedQuality and Reliability Engineering International

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Advanced Statistical Process Monitoring Management and Optimization Techniques Fault Detection and Control Systems

Abstract

Abstract The control chart based on cumulative count of conforming (CCC) items between the occurrence of two non‐conforming ones, or the CCC chart, has been shown to be very useful for monitoring high‐quality processes. However, as in the implementation of other Shewhart‐type control charts, it is usually assumed that the inspection is free of error. This assumption may not be valid and this may have a significant impact on the interpretation of the control chart and the setting of control limits. This paper first investigates the effect of inspection errors and discusses the setting of control limits in such cases. Even if inspection errors are considered, the average time to alarm increases in the beginning when the process deteriorates. Since this is undesirable, the control limits in the presence of inspection errors should be set so as to maximize the average run length when the process is at the normal level. A procedure is presented for solving this problem. Copyright © 2003 John Wiley & Sons, Ltd.

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References

2000Statistical Methods for Quality Improvement 1997Control Charts Based on Attribute Data: Bibliography and Review 1992Statistical Control Charts Based on a Geometric Distribution 1990Statistical Methods for Quality Improvement 1991Inspection Errors for Attributes in Quality Control 1992Some procedures for decision making in controlling high yield processes 1997The use of probability limits for process control based on geometric distribution 1994‘On‐line’G‐control chart for attribute data

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2014ARL-unbiased control charts for the monitoring of exponentially distributed characteristics based on type-II censored samples 2007Monitoring process for attributes with quality deterioration and diagnosis errors 2007Gauge capability studies for attribute data 2009A new approach to setting control limits of cumulative count of conforming charts for high‐yield processes 2015Optimal design of a synthetic chart for monitoring process dispersion with unknown in-control variance

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