Evaluation of process capability indices of linear profiles

Zahra Hosseinifard · Babak Abbasi

51 citations0/0 files storedInternational Journal of Quality & Reliability Management

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Advanced Statistical Process Monitoring Management and Optimization Techniques Fault Detection and Control Systems

Abstract

Purpose In profile monitoring, which is a growing research area in the field of statistical process control, the relationship between response and explanatory variables is monitored over time. The purpose of this paper is to focus on the process capability analysis of linear profiles. Process capability indices give a quick indication of the capability of a manufacturing process. Design/methodology/approach In this paper, the proportion of the non‐conformance criteria is employed to estimate process capability index. The paper has considered the cases where specification limits is constant or is a function of explanatory variable X. Moreover, cases where both equal and random design schemes in profile data acquisition is required (as the explanatory variable) is considered. Profiles with the assumption of deterministic design points are usually used in the calibration applications. However, there are other applications where design points within a profile would be i.i.d. random variables from a given distribution. Findings Simulation studies using simple linear profile processes for both fixed and random explanatory variable with constant and functional specification limits are considered to assess the efficacy of the proposed method. Originality/value There are many cases in industries such as semiconductor industries where quality characteristics are in form of profiles. There is no method in the literature to analyze process capability for theses processes, however recently quite a few methods have been presented in monitoring profiles. Proposed methods provide a framework for quality engineers and production engineers to evaluate and analyze capability of the profile processes.

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References

1992Introduction to Statistical Quality Control 1986Process Capability Indices 1995Process Capability Indices.1988A New Measure of Process Capability:Cpm 2000On-Line Monitoring When the Process Yields a Linear Profile 2004Using Control Charts to Monitor Process and Product Quality Profiles 2004Phase I Analysis of Linear Profiles With Calibration Applications 2007Current research on profile monitoring

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2014A Process Yield for Simple Linear Profiles 2013Measuring Process Yield for Nonlinear Profiles 2012Evaluation of process capability in multivariate simple linear profiles 2012Process Capability Analysis in Non Normal Linear Regression Profiles 2016MEWMA Control Chart and Process Capability Indices for Simple Linear Profiles with Within‐profile Autocorrelation 2013Measuring the Process Yield for Simple Linear Profiles with one‐Sided Specification

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