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Determining mean thickness of the oxide layer by mapping the surface of a silicon sphere

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References

2003Determination of the Avogadro constant via the silicon route167 cited
2001History and progress in the accurate determination of the Avogadro constant142 cited
2006Considerations on future redefinitions of the kilogram, the mole and of other units118 cited
1999Determination of the Avogadro constant by accurate measurement of the molar volume of a silicon crystal81 cited
2009The Avogadro constant determination via enriched silicon-2874 cited
1974Geometrical considerations in the measurement of the volume of an approximate sphere39 cited
2006Primary calibration of the volume of silicon spheres32 cited
2007Density Determination of Silicon Spheres Using an Interferometer With Optical Frequency Tuning27 cited
1994Volume of Quasi-spherical Solid Density Standards21 cited
1999Surface layer impurities on silicon spheres used in determination of the Avogadro constant12 cited

Cited by

2013Interferometric diameter determination of a silicon sphere using a traceable single laser frequency synthesizer9 cited

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