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Safety Regions in Process Capability Plots
6 references·14 citing·30 second hop
Safety Regions in Process Capability Plots (2006)Safety Regions in Process Capability PlotsProcess Capability Indices (2017)Process Capability IndicesProcess Capability Indices—A Review, 1992–2000 (2002)Process Capability Indices—A …A uniformed approach to capability indices (1995)A uniformed approach to capab…Process Capability Indices (1993)Process Capability IndicesDistributional and Inferential Properties of Process Capability Indices (1992)Distributional and Inferentia…The Taguchi Capability Index (1991)The Taguchi Capability IndexIntegrated green‐and‐quality inspection schemes for green product quality with six‐sigma yield assurance and risk management (2023)Integrated green‐and‐quality …Modified weighted standard deviation index for adequately interpreting a supplier’s lognormal process capability (2018)Modified weighted standard de…A sequential hypothesis testing procedure for the process capability index Cpk (2018)A sequential hypothesis testi…Testing and Ranking Multiple Wafer-Manufacturing Processes With Fuzzy-Quality Data (2016)Testing and Ranking Multiple …Markov chain Monte Carlo in Bayesian models for testing gamma and lognormal S-type process qualities (2016)Markov chain Monte Carlo in B…A sequential hypothesis testing procedure for the process capability index Cpk (2016)A sequential hypothesis testi…New Insights into the Decisional Use of Process Capability Indices via Hypothesis Testing (2014)New Insights into the Decisio…Process Performance Evaluation with Imprecise Information (2009)Process Performance Evaluatio…Photolithography Control in Wafer Fabrication Based on Process Capability Indices With Multiple Characteristics (2009)Photolithography Control in W…Sample size determination for production yield estimation with multiple independent process characteristics (2008)Sample size determination for…Average run length when monitoring capability indices using EWMA (2008)Average run length when monit…Process Capability Plots for One-Sided Specification Limits (2007)Process Capability Plots for …Process Capability Analysis with Focus on Indices for One-sided Specification Limits (2006)Process Capability Analysis w…The Circular Safety Region: a Useful Graphical Tool in Capability Analysis (2005)The Circular Safety Region: a…Quality-Control Handbook. (1952)Process Capability Indices (1986)Process Capability Indices. (1995)An overview of theory and practice on process capability indices for quality assurance (2008)Introduction to Quality Engineering (2008)Brocess capability with asymmetric tolerances (1994)On the distribution of the estimated process yield index Spk (2002)Capability measures for processes with multiple characteristics (2003)Generalized Inference for Measuring Process Yield With the Contamination of Measurement Errors—Quality Control for Silicon Wafer Manufacturing Processes in the Semiconductor Industry (2011)Measuring the Manufacturing Yield for Processes With Multiple Manufacturing Lines (2011)A Note on “Capability Assessment for Processes with Multiple Characteristics: A Generalization of the Popular Index Cpk” (2012)A New Measure of Process Capability:Cpm (1988)Fuzzy process capability plots for families of one-sided specification limits (2012)UNIVARIATE PROCESS CAPABILITY INDICES FOR UNILATERAL SPECIFICATION REGION — A REVIEW AND SOME MODIFICATIONS (2012)Juran's Quality Control Handbook (1990)An effective decision making method for product acceptance (2005)A variables sampling plan based on Cpmk for product acceptance determination (2007)Vendor selection criteria and methods (1991)A fuzzy approach to determine process quality for one-sided specification with imprecise data (2020)Fuzzy process capability analysis for machined product with multiple characteristics of symmetric tolerance (2022)The moderating effects of institutional pressures on emergent green supply chain practices and performance (2007)A literature review on green supply chain management: Trends and future challenges (2018)Development of a generalised dual sampling system with a flexible decision-rule-transformation mechanism (2024)Integrating capability index and generalized rule-switching mechanism for enhanced quick-switch sampling systems (2024)Optimal design of an integrated inspection scheme with two adjustable sampling mechanisms for lot disposition (2024)Using principal component analysis in process performance for multivariate data (2000)Statistical Quality Control (2008)Computing process capability indices for non-normal data: a review and comparative study (1999)Statistical testing for assessing the performance of lifetime index of electronic components with exponential distribution (2002)Multivariate statistical process control—recent results and directions for future research (1994)
this work references cited by second hop

References

  • 1992Distributional and Inferential Properties of Process Capability Indices700 cited
  • 1991The Taguchi Capability Index557 cited
  • 2002Process Capability Indices—A Review, 1992–2000511 cited
  • 1993Process Capability Indices445 cited
  • 2017Process Capability Indices235 cited
  • 1995A uniformed approach to capability indices170 cited

Cited by

  • 2009Photolithography Control in Wafer Fabrication Based on Process Capability Indices With Multiple Characteristics25 cited
  • 2007Process Capability Plots for One-Sided Specification Limits19 cited
  • 2023Integrated green‐and‐quality inspection schemes for green product quality with six‐sigma yield assurance and risk management18 cited
  • 2018Modified weighted standard deviation index for adequately interpreting a supplier’s lognormal process capability16 cited
  • 2008Sample size determination for production yield estimation with multiple independent process characteristics14 cited
  • 2014New Insights into the Decisional Use of Process Capability Indices via Hypothesis Testing13 cited
  • 2005The Circular Safety Region: a Useful Graphical Tool in Capability Analysis12 cited
  • 2018A sequential hypothesis testing procedure for the process capability index Cpk11 cited

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  • 2016A sequential hypothesis testing procedure for the process capability index Cpk10 cited
  • 2009Process Performance Evaluation with Imprecise Information10 cited
  • 2016Testing and Ranking Multiple Wafer-Manufacturing Processes With Fuzzy-Quality Data9 cited
  • 2006Process Capability Analysis with Focus on Indices for One-sided Specification Limits9 cited
  • 2016Markov chain Monte Carlo in Bayesian models for testing gamma and lognormal S-type process qualities8 cited
  • 2008Average run length when monitoring capability indices using EWMA8 cited