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ArticleSimplified resubmitted lot inspection from defect counts

Arturo J. Fernández2016

Article2016

Simplified resubmitted lot inspection from defect counts

Arturo J. Fernández · Carlos J. Pérez-González

5 citations·0/0 files stored·The International Journal of Advanced Manufacturing Technology

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Advanced Statistical Process Monitoring Management and Optimization Techniques Industrial Vision Systems and Defect Detection

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References

2006Multiple dependent state sampling plans for lot acceptance based on measurement data 1998Designs of One- and Two-Sided Exponential EWMA Charts 2004Acceptance Sampling Based on Truncated Life Tests in the Birnbaum Saunders Model 2011Variables sampling inspection scheme for resubmitted lots based on the process capability index Cpk 2012Variable sampling inspection for resubmitted lots based on process capability index Cpk for normally distributed items 1997Sampling inspection for resubmitted lots 2014A resubmitted sampling scheme by variables inspection for controlling lot fraction nonconforming 2014Multiple dependent state variable sampling plans with process loss consideration

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2016Explicit quasi-optimal inspection schemes from nonconformity count data with controlled producer and consumer risksarticle · 11 shared references 2015Optimal schemes for resubmitted lot acceptance using previous defect count dataarticle · 7 shared references 2019Optimal attribute sampling plans in closed-formsarticle · 7 shared references 2015A Single Sampling Plan Based on Exponentially Weighted Moving Average Model for Linear Profilesarticle · 6 shared references 2019Acceptance sampling plans based on EWMA yield index for the first order autoregressive processarticle · 6 shared references 2014A flexible process-capability-qualified resubmission-allowed acceptance sampling schemearticle · 5 shared references

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Year2016

Typearticle

Published2016-02-27

VenueThe International Journal of Advanced Manufacturing Technology

ISSN-L0268-3768

Languageen

Citations5

Files0 public / 0

ShelfAdvanced Statistical Process Monitoring

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doi10.1007/s00170-016-8503-x

openalex_workW2292874575

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