Global Sensitivity Analysis and Uncertainty Quantification of Radiated Susceptibility in PCB Using Nonintrusive Polynomial Chaos Expansions

Abstract

In this paper, we introduce a workflow that uses uncertainty quantification (UQ) and sensitivity analysis (SA) in conjunction with a metamodeling technique called polynomial chaos expansion (PCE) to investigate the stochastic terminal response of a printed circuit board (PCB) due to an external plane wave excitation. The objective of PCE use is to reduce the computational burden of commonly used Monte Carlo (MC) approach for calculating statistical moments and Sobol' sensitivity indices in the presence of uncertain geometrical and electrical parameters of the investigated PCB. The statistical results computed by PCE has been shown to be very accurate compared to MC simulation results.

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