SkSP-V Sampling Plan for the Exponentiated Weibull Distribution

Abstract

Abstract The purpose of this paper is to design an SkSP-V acceptance sampling plan for assuring percentiles based on a time-truncated life test as the reference plan when the lifetime of a product follows an exponentiated Weibull distribution. Using the non-linear optimization solution, the plan parameters are determined so as to satisfy the producer's and the consumer's risks. Tables are provided for practical use and an example is shown with a real case. Finally, the results are compared with the single sampling plan in terms of the average sample number to demonstrate the efficiency of the proposed plan.

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