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Raw material quality control is one of the most important subjects for foundry manufacturing process with the advancing of semiconductor technology into nanometer nodes. Therefore, how to effectively detect abnormality at the early stage of raw material incoming or even at supplier sites become one more challenge topic. The successful early detection can reduce foundry manufacturing risk and cost. This paper will focus on the application of quality control method on both suppliers and foundry. The purpose is to reduce foundry manufacturing risk by implementing the best quality control methodology on raw material manufacturing process at supplier site and the early detection of nonconformance in raw material incoming inspection stage at foundry site.
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Stored only when both papers are in the corpus — 5 citations exist upstream.
Papers that cite the same references — the relational fallback while embeddings are still backfilling.
Imported from OpenAlex (CC0) — nothing here is generated.