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SI-traceable determination of the spring constant of a soft cantilever using the nanonewton force facility based on electrostatic methods

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References

2005Review of SI traceable force metrology for instrumented indentation and atomic force microscopy108 cited
2006Prototype cantilevers for SI-traceable nanonewton force calibration74 cited
2003Accurate analytical measurements in the atomic force microscope: a microfabricated spring constant standard potentially traceable to the SI73 cited
2011Report on the first international comparison of small force facilities: a pilot study at the micronewton level67 cited
2007Facility and methods for the measurement of micro and nano forces in the range below 10−5N with a resolution of 10−12N (development concept)63 cited
2006Atomic force microscope cantilever calibration device for quantified force metrology at micro- or nano-scale regime: the nano force calibrator (NFC)53 cited
2007SI-traceable determination of spring constants of various atomic force microscope cantilevers with a small uncertainty of 1%47 cited
2009A new facility to realize a nanonewton force standard based on electrostatic methods45 cited

Cited by

2019Photon momentum induced precision small forces: a static and dynamic check8 cited
2019The Status of PTB’s Nanonewton Force Facility7 cited

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