Comparison between count of cumulative conforming sampling plans and Dodge–Romig single sampling plan

Abstract

In this research, a new sampling system is introduced based on the concept of count of cumulative conforming control charts (CCC-charts). The proposed method is based on Markov modeling and negative binomial distribution. The proposed sampling system is compared with traditional sampling methods like Dodge–Romig single sampling plan based on lot tolerance percent defective (LTPD) and Dodge–Romig single sampling plan based on average outgoing quality limit (AOQL) and its superiority for larger values of lot sizes and process average is denoted using a comparison study.

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