Resubmitted lots with single sampling plans by attributes under the conditions of zero-inflated poisson distribution

Abstract

For a well-monitored process, occurrence of nondefect is a frequent event sampling inspection. A suitable model for this situation is a zero-inflated Poisson (ZIP) distribution. In this manuscript, we will focus on the designing of a more flexible sampling plan called the resubmitted lots plan. The parameters of the proposed sampling plan are determined through the nonlinear optimization solution. The advantage of the proposed plan over the existing sampling in terms of average sample number is discussed. An example is given for the illustration purpose.

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