A mixed control chart adapted to the truncated life test based on the Weibull distribution

Abstract

The design of a new mixed attribute control chart adapted to a truncated life test has been presented. It was assumed that the lifetime of a product follows the Weibull distribution and the number of failures was observed using a truncated life test, where the test duration was specified as a fraction of the mean lifespan. The proposed control chart consists of two pairs of control limits based on a binomial distribution and one lower bound. The average run length of the chart was determined for various levels of shift constants and specified parameters. The efficiency of the chart is compared with an existing control chart in terms of the average run length. The application of the proposed chart is discussed with the aid of a simulation study. (original abstract)

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