A New Control Chart for Monitoring Reliability Using Sudden Death Testing Under Weibull Distribution

Abstract

In this paper, a new control chart using sudden death testing is designed by assuming that the lifetime/failure time of the product follows the Weibull distribution. The structure of the proposed chart is presented. The control chart coefficient is determined using some specified average run length for the in control process and the shifted process. Simulation study is given for the illustration purpose.

Cite this work

No public copy is stored for this record, so only the metadata is cited.

Stored only when both papers are in the corpus — 7 citations exist upstream.

Papers that cite the same references — the relational fallback while embeddings are still backfilling.