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Process capability indices such as Cp, CpL, CpU, and Cpk have been used for evaluating the performance of a manufacturing process in statistical quality control and statistical process control fields. In this paper, a Bayes estimator of Cpk is constructed such that the prior mean is set to be equal to a specified value while the prior distribution is weakly informative. This estimator is compared with conventional Bayes and non Bayes estimators.
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