New Algorithms for Item Selection and Exposure Control with Computerized Adaptive Testing.

Abstract

Computerized adaptive testing (CAT) offers the prospect of both reducing testing time and increasing measurement precision when compared to conventional pencil-and-paper tests. Although adaptive tests acquire their efficiency by successively selecting items that provide optimal` *. measurement at each examinee's estimated level of ability, operational testing programs will typically consider additional factors in item selection. In practice, items are generally selected with regard to at least three, often conflicting goals: 1) to maximize test efficiency by measuring examinees as quickly and as accurately as possible, 2) to protect the security of the item pool by controlling the rates at which popular items can be administered, and 3) to assure that the test measures the same composite of multiple traits for each examinee by balancing the rates at which items with different content properties are administered. This paper focuses on the goals of maximizing test efficiency and controlling item exposure rates, avoiding discussion of content balance. While a number of algorithms for accomplishing these goals have been developed, all are problematic to some extent. We briefly sketch the nature of these problems, and then present alternative algorithms that offer at least a partial solution. U.S. DEPARTMENT OF EDUCATION Office of Educational Research and Improvement EDUCATIONAL RESOURCES INFORMATION CENTER (ERIC) Crfhis document has been reproduced as received from the person or organization originating it. Minor changes have heen made to improve reproduction quality. Points of view or opinions stated in this CO document do not necessarily represent official OERI position or policy. Co tN 2 PERMISSION TO REPRODUCE AND DISSEMINATE THIS MATERIAL HAS BEEN GRANTED BY iclhAc511A.IL TO THE EDUCATIONAL RESOURCES INFORMATION CENTER (ERIC) 1 Paper presented at the annual meeting of the American Educational Research Association, April 18-22, 1995, San Francisco New Algorithms for CAT 2 New Algorithms for Item Selection and Exposure Control with Computerized Adaptive Testing

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