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A Note on “Capability Assessment for Processes with Multiple Characteristics: A Generalization of the Popular Index Cpk”
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A Note on “Capability Assessment for Processes with Multiple Characteristics: A Generalization of the Popular Index Cpk” (2012)A Note on “Capability Assessment for Proc…Capability assessment for processes with multiple characteristics: A generalization of the popular index Cpk (2011)Capability assessment for pro…The development of a target‐focused process capability index with multiple characteristics (2010)The development of a target‐f…Multiresponse optimization using multivariate process capability index (2010)Multiresponse optimization us…Developing a sampling plan based on Cpk—unknown variance (2010)Developing a sampling plan ba…A bibliography of the literature on process capability indices: 2000–2009 (2010)A bibliography of the literat…Process selection for higher production yield based on capability index Spk (2009)Process selection for higher …Photolithography Control in Wafer Fabrication Based on Process Capability Indices With Multiple Characteristics (2009)Photolithography Control in W…New capability indices for evaluating the performance of multivariate manufacturing processes (2009)New capability indices for ev…Measuring manufacturing capability for couplers and wavelength division multiplexers (2004)Measuring manufacturing capab…Implementing EWMA Yield Index for Simple Linear Profiles with One-sided Specifications in Product Acceptance Determination (2016)Implementing EWMA Yield Index…Process Yield for Multivariate Linear Profiles with One-sided Specification Limits (2015)Process Yield for Multivariat…Supplier Selection Critical Decision Values for Processes with Multiple Independent Lines (2012)Supplier Selection Critical D…Process Capability Indices—A Review, 1992–2000 (2002)An overview of theory and practice on process capability indices for quality assurance (2008)Phase II monitoring of multivariate simple linear profiles (2009)Process capability index for Poisson regression profile based on the Spmk index (2018)Process Capability Indices (1986)A New Measure of Process Capability:Cpm (1988)Process Capability Indices. (1995)Group selection for production yield among k manufacturing lines (2010)Efficient methods for comparing two process yields – strategies on supplier selection (2012)Multiple Comparisons with the Best for Supplier Selection (2013)Quality Control and Industrial Statistics (1988)Developing a Sampling Plan Based onCpk (2009)Design and Construction of a Variables Repetitive Group Sampling Plan for Unilateral Specification Limit (2013)A flexible process-capability-qualified resubmission-allowed acceptance sampling scheme (2014)A modified variables repetitive group sampling plan with the consideration of preceding lots information (2015)The Taguchi Capability Index (1991)Supplier Selection for Multiple-Characteristics Processes with One-Sided Specifications (2013)Monitoring high complex production processes using process capability indices (2017)Optimal design of overall yield-based variable repetitive sampling plans for processes with multiple characteristics (2019)Simultaneous Optimization of Several Response Variables (1980)Quality Engineering Using Robust Design (1990)Design and Analysis of Experiments (2005)An Integrated Approach Based on Principal Component and Multivariate Process Capability for Simultaneous Optimization of Location and Dispersion for Correlated Multiple Response Problems (2013)A Bibliography of Process Capability Papers (2003)Variables sampling inspection scheme for resubmitted lots based on the process capability index Cpk (2011)Variable sampling inspection for resubmitted lots based on process capability index Cpk for normally distributed items (2012)Designing of X-bar control charts based on process capability index using repetitive sampling (2013)Distributional and Inferential Properties of Process Capability Indices (1992)A note on multivariate capability indices (1993)Comparison of Three Multivariate Process Capability Indices (2000)A new process capability index for multiple quality characteristics based on principal components (2015)A review of univariate and multivariate process capability indices (2017)Construction and fuzzy hypothesis testing of Taguchi Six Sigma quality index (2019)Brocess capability with asymmetric tolerances (1994)On the distribution of the estimated process yield index Spk (2002)Capability measures for processes with multiple characteristics (2003)Generalized Inference for Measuring Process Yield With the Contamination of Measurement Errors—Quality Control for Silicon Wafer Manufacturing Processes in the Semiconductor Industry (2011)Measuring the Manufacturing Yield for Processes With Multiple Manufacturing Lines (2011)Process yield analysis for multivariate linear profiles (2016)An Extension of the Product Acceptance Determination for One‐Sided Process with Multiple Characteristics (2012)A loss-function based approach for evaluating reliability improvement of an engineering design (2013)An improved measure of quality loss for notching processes (2020)Supplier selection for one-sided processes with unequal sample sizes (2008)A General Procedure for Process Yield With Multiple Characteristics (2010)Yield-Based Capability Index for Evaluating the Performance of Multivariate Manufacturing Process (2013)
this work references cited by second hop

References

  • 2010A bibliography of the literature on process capability indices: 2000–2009153 cited
  • 2009New capability indices for evaluating the performance of multivariate manufacturing processes73 cited
  • 2010Developing a sampling plan based on Cpk—unknown variance49 cited
  • 2011Capability assessment for processes with multiple characteristics: A generalization of the popular index Cpk37 cited
  • 2009Process selection for higher production yield based on capability index Spk32 cited
  • 2004Measuring manufacturing capability for couplers and wavelength division multiplexers32 cited
  • 2010Multiresponse optimization using multivariate process capability index30 cited
  • 2009Photolithography Control in Wafer Fabrication Based on Process Capability Indices With Multiple Characteristics25 cited
  • 2010The development of a target‐focused process capability index with multiple characteristics23 cited

Cited by

  • 2015Process Yield for Multivariate Linear Profiles with One-sided Specification Limits15 cited
  • 2012Supplier Selection Critical Decision Values for Processes with Multiple Independent Lines13 cited
  • 2016Implementing EWMA Yield Index for Simple Linear Profiles with One-sided Specifications in Product Acceptance Determination11 cited

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